[2014 ESSDERC] Analysis of Failure Mechanisms in Erased State of Sub 20-nm NAND Flash Memory

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[2014 ESSDERC] Analysis of Failure Mechanisms in Erased State of Sub 20-nm NAND Flash Memory

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Kyunghwan Lee,Duckseoung Kang, sangjin Kwon, Shinhyung Kim, Yuchul Hwang and Hyungcheol Shin, “Analysis of Failure Mechanisms in Erased State of Sub 20-nm NAND Flash Memory”, European Solid-State Device Research Conference (ESSDERC), 2014

[2014 ESSDERC] Analysis of Failure Mechanisms in Erased State of Sub 20-nm NAND Flash Memory

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