Sungwon Yoo, Youngsoo Seo and Hyungcheol Shin, “Analysis on Trapping Mechanism of Trap Causing Gate-Induced Drain Leakage Current Random Telegraph Noise” , Silicon Nanoelectronics Workshop(SNW), 2014.
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Sungwon Yoo, Youngsoo Seo and Hyungcheol Shin, “Analysis on Trapping Mechanism of Trap Causing Gate-Induced Drain Leakage Current Random Telegraph Noise” , Silicon Nanoelectronics Workshop(SNW), 2014.