Dokyun Son, Duckseong Kang, Sungwon Yoo, Youngsoo Seo and Hyungcheol Shin, “Impact of Line Edge Roughness on RTN in SRAM Cells with 70 Å Nanowire FET”, Silicon Nanoelectronics Workshop(SNW), 2014.
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Dokyun Son, Duckseong Kang, Sungwon Yoo, Youngsoo Seo and Hyungcheol Shin, “Impact of Line Edge Roughness on RTN in SRAM Cells with 70 Å Nanowire FET”, Silicon Nanoelectronics Workshop(SNW), 2014.