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[2015 AWAD] Analysis of Band to Band Tunneling Characteristics according to the impact of Traps in c

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Dokyun Son, Duckseoung Kang, Hyunsuk Kim, Sangbin Jeon, and Hyungcheol Shin, “Analysis of Band to Band Tunneling Characteristics according to the impact of Traps in cSiGe FinFETs”, 2015 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD), 2015.