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[2015 AWAD] Analysis on Self-Heating Effect in 7 nm node Bulk FinFET device

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Sungwon Yoo, Hyunsuk Kim and Hyungcheol Shin, “Analysis on Self-Heating Effect in 7 nm node Bulk FinFET device”, Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD).