Home · [2015 ITC-CSCC] Analysis of GIDL in PMOS SiGe FinFETs under Various Dit Conditions
Home · [2015 ITC-CSCC] Analysis of GIDL in PMOS SiGe FinFETs under Various Dit Conditions
[2015 ITC-CSCC] Analysis of GIDL in PMOS SiGe FinFETs under Various Dit Conditions
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Hyunsuk Kim, Dokyun Son, Sangbin,Jeon,Duckseong Kang and Hyungcheol Shin, “Analysis of GIDL in PMOS SiGe FinFETs under Various Dit Conditions”, International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC),2015.