Home · [2015 KCS] The Comparison of Electrical Characteristics Between Nanoplate Fet and FinFET for 5 nm node Technology
Home · [2015 KCS] The Comparison of Electrical Characteristics Between Nanoplate Fet and FinFET for 5 nm node Technology
[2015 KCS] The Comparison of Electrical Characteristics Between Nanoplate Fet and FinFET for 5 nm node Technology
기간
2015
참가자
Duckseong Kang, Jongsu Kim and Hyungcheol Shin
대회명
Korean Conference on Semiconductors
Duckseong Kang, Jongsu Kim and Hyungcheol Shin, “The Comparison of Electrical Characteristics Between Nanoplate Fet and FinFET for 5 nm node Technology” Korean Conference on Semiconductors(KCS), 2015.