[2015 KCS] The Influence of Variability Sources on SRAM Stability in 90 Å Non-Rectangular Bulk FinFET SRAM Cell

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[2015 KCS] The Influence of Variability Sources on SRAM Stability in 90 Å Non-Rectangular Bulk FinFET SRAM Cell

기간

2015

참가자

Sung-Won Yoo, Youngsoo Seo, Do-Gyun Son, and Hyungcheol Shin

대회명

Korean Conference on Semiconductors

Sung-Won Yoo, Youngsoo Seo, Do-Gyun Son, and Hyungcheol Shin, “The Influence of Variability Sources on SRAM Stability in 90 Å Non-Rectangular Bulk FinFET SRAM Cell”, Korean Conference on Semiconductors(KCS), 2015.

[2015 KCS] The Influence of Variability Sources on SRAM Stability in 90 Å Non-Rectangular Bulk FinFET SRAM Cell

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