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[2016 KCS] Investigation of Retention Characteristics in NAND Flash Memory

기간

2016

참가자

Kyunghwan Lee, Myounggon Kang, and Hyungcheol Shin

대회명

Korean Conference on Semiconductors

Kyunghwan Lee, Myounggon Kang, and Hyungcheol Shin, “Investigation of Retention Characteristics in NAND Flash Memory”, Korean Conference on Semiconductors(KCS), 2016.