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Home · [2016 Nano Korea] Analysis of current-boosting using strain engineering and trenched source/drain in single & stacked nanowire FET
Home · [2016 Nano Korea] Analysis of current-boosting using strain engineering and trenched source/drain in single & stacked nanowire FET

[2016 Nano Korea] Analysis of current-boosting using strain engineering and trenched source/drain in single & stacked nanowire FET

기간

2016

참가자

Youngsoo Seo, Hyunsuk Kim, Myounggon Kang and Hyungcheol Shin

대회명

NANO Korea

Youngsoo Seo, Hyunsuk Kim, Myounggon Kang and Hyungcheol Shin, “Analysis of current-boosting using strain engineering and trenched source/drain in single & stacked nanowire FET”, Nano Korea, 2016.

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