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Home · [2016 Nano Korea] Analysis of Performance and Reliability between Nanowire FET and FinFET for Future
Home · [2016 Nano Korea] Analysis of Performance and Reliability between Nanowire FET and FinFET for Future

[2016 Nano Korea] Analysis of Performance and Reliability between Nanowire FET and FinFET for Future

기간

2016

참가자

Hyunsuk Kim, Duckseoung Kang, Myounggon Kang and Hyungcheol Shin

대회명

NANO Korea

Hyunsuk Kim, Duckseoung Kang, Myounggon Kang and Hyungcheol Shin, “Analysis of Performance and Reliability between Nanowire FET and FinFET for Future Device”, Nano Korea, 2016.

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