Shinkeun Kim, Kyul Ko, Dokyun Son, Myounggon Kang, and Hyungcheol Shin, “Statistical Analysis of NBTI Considering Trap Position in Nanosheet FET”, Korea Conference on Semiconductor (KCS), 2018.
기간
2018
참가자
Shinkeun Kim, Kyul Ko, Dokyun Son, Myounggon Kang, and Hyungcheol Shin
대회명
Korean Conference on Semiconductors
Shinkeun Kim, Kyul Ko, Dokyun Son, Myounggon Kang, and Hyungcheol Shin, “Statistical Analysis of NBTI Considering Trap Position in Nanosheet FET”, Korea Conference on Semiconductor (KCS), 2018.