Changbeom Woo, Jang Kyu Lee, Myounggon Kang, Jongwook Jeon, and Hyungcheol Shin, “Impact of Geometry Parameters in Negative Capacitance FinFET”, IEEE Silicon Nanoelectronics Workshop (SNW), 2018.
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Changbeom Woo, Jang Kyu Lee, Myounggon Kang, Jongwook Jeon, and Hyungcheol Shin, “Impact of Geometry Parameters in Negative Capacitance FinFET”, IEEE Silicon Nanoelectronics Workshop (SNW), 2018.