Jaeyeol Park, Changbeom Woo, Shinkeun Kim, and Hyungcheol Shin, “Effect of Cell Scaling on Lateral Migration of Holes in VNAND Flash Memory”, Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD), 2019.
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Jaeyeol Park, Changbeom Woo, Shinkeun Kim, and Hyungcheol Shin, “Effect of Cell Scaling on Lateral Migration of Holes in VNAND Flash Memory”, Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD), 2019.