Jongsu Kim, Myounggon Kang, Jongwook Jeon, and Hyungcheol Shin, “Analysis of Hot Carrier Degradation in Short Channel MOSFET according to Temperature”, Korea Conference on Semiconductor (KCS), 2019.
기간
2019
참가자
Jongsu Kim, Myounggon Kang, Jongwook Jeon, and Hyungcheol Shin
대회명
Korean Conference on Semiconductors
Jongsu Kim, Myounggon Kang, Jongwook Jeon, and Hyungcheol Shin, “Analysis of Hot Carrier Degradation in Short Channel MOSFET according to Temperature”, Korea Conference on Semiconductor (KCS), 2019.