Yeaji Yoo, Kyul Ko, Myounggon Kang, Jongwook Jeon, and Hyungcheol Shin, “Interplay Between Line Edge Roughness and Interface Traps in Nanoplate VFETs”, Korea Conference on Semiconductor (KCS), 2019.
기간
2019
참가자
Yeaji Yoo, Kyul Ko, Myounggon Kang, Jongwook Jeon, and Hyungcheol Shin
대회명
Korean Conference on Semiconductors
Yeaji Yoo, Kyul Ko, Myounggon Kang, Jongwook Jeon, and Hyungcheol Shin, “Interplay Between Line Edge Roughness and Interface Traps in Nanoplate VFETs”, Korea Conference on Semiconductor (KCS), 2019.