Changbeom Woo, Shinkeun Kim, Jaeyeol Park, and Hyungcheol Shin, “Effect of Device Scaling on Lateral Migration Mechanism of Electrons in V-NAND”, IEEE Silicon Nanoelectronics Workshop (SNW), 2019.
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Changbeom Woo, Shinkeun Kim, Jaeyeol Park, and Hyungcheol Shin, “Effect of Device Scaling on Lateral Migration Mechanism of Electrons in V-NAND”, IEEE Silicon Nanoelectronics Workshop (SNW), 2019.