[2019 SNW] Prediction of Characteristics of Future Scaled 3D NAND Flash Memory by Using TCAD and SPI

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[2019 SNW] Prediction of Characteristics of Future Scaled 3D NAND Flash Memory by Using TCAD and SPI

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Minsoo Kim, and Hyungcheol Shin, “Prediction of Characteristics of Future Scaled 3D NAND Flash Memory by Using TCAD and SPICE”, IEEE Silicon Nanoelectronics Workshop (SNW), 2019.

[2019 SNW] Prediction of Characteristics of Future Scaled 3D NAND Flash Memory by Using TCAD and SPI

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