Sangmin Ahn and Hyungcheol Shin, “The Investigation of Random Telegraph Noise effect on the Extremely Narrow Vth Distribution in 3D NAND Flash Memory,” 대한전자공학회 하계학술대회, 2023.
기간
2023
참가자
Sangmin Ahn and Hyungcheol Shin
대회명
대한전자공학회 추계학술대회
Sangmin Ahn and Hyungcheol Shin, “The Investigation of Random Telegraph Noise effect on the Extremely Narrow Vth Distribution in 3D NAND Flash Memory,” 대한전자공학회 하계학술대회, 2023.