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[2024 KCS] Investigation of Grain Boundary Effect on Threshold Voltage and ISPP Slope in 3D NAND Flash Memories

기간

2024

참가자

Insang Han, Sangmin Ahn, and Hyungcheol Shin

대회명

Korean Conference on Semiconductors

Insang Han, Sangmin Ahn, and Hyungcheol Shin, “Investigation of Grain Boundary Effect on Threshold Voltage and ISPP Slope in 3D NAND Flash Memories,” Korea Conference on Semiconductor (KCS), 2024.