Home · [2024 KCS] Process Variability Analysis in 3D NAND Macaroni Structures : Machine Learning for Predicting Program and Erase Characteristics
Home · [2024 KCS] Process Variability Analysis in 3D NAND Macaroni Structures : Machine Learning for Predicting Program and Erase Characteristics
[2024 KCS] Process Variability Analysis in 3D NAND Macaroni Structures : Machine Learning for Predicting Program and Erase Characteristics
기간
2024
참가자
Hwanheechan Choi, Jangkyu Lee, and Hyungcheol Shin
대회명
Korean Conference on Semiconductors
Hwanheechan Choi, Jangkyu Lee, and Hyungcheol Shin, “Process Variability Analysis in 3D NAND Macaroni Structures : Machine Learning for Predicting Program and Erase Characteristics,” Korea Conference on Semiconductor (KCS), 2024.