Myounggon Kang, In Man Kang, and Hyungcheol Shin, “Extraction and Modeling of Gate Electrode Resistance In RF MOSFETs,” 2005 International Conference on Integrated Circuit Design and Technology, Texas, U.S.A., pp. 207-210, May 9-11, 2005
기간
May 9-11, 2005
참가자
Myounggon Kang, In Man Kang, and Hyungcheol Shin
대회명
2005 International Conference on Integrated Circuit Design and Technology, Texas, U.S.A.
Myounggon Kang, In Man Kang, and Hyungcheol Shin, “Extraction and Modeling of Gate Electrode Resistance In RF MOSFETs,” 2005 International Conference on Integrated Circuit Design and Technology, Texas, U.S.A., pp. 207-210, May 9-11, 2005