[IEEK Fall Conference 2005] Extraction of substrate resistance parameters for RF MOSFETs based on three-port measurement

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Home · [IEEK Fall Conference 2005] Extraction of substrate resistance parameters for RF MOSFETs based on three-port measurement

[IEEK Fall Conference 2005] Extraction of substrate resistance parameters for RF MOSFETs based on three-port measurement

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November 26, 2005

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강인만, 신형철

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IEEK Fall Conference 2005

강인만, 신형철, “Extraction of substrate resistance parameters for RF MOSFETs based on three-port measurement,” IEEK Fall Conference 2005, Seoul, Korea, pp.809-812, November 26, 2005

[IEEK Fall Conference 2005] Extraction of substrate resistance parameters for RF MOSFETs based on three-port measurement

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