[IEEK Fall Conference 2005] Low frequency noise characteristics of the 180nm MOSFETs

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[IEEK Fall Conference 2005] Low frequency noise characteristics of the 180nm MOSFETs

기간

November 26, 2005

참가자

윤영창, Hochul Lee, 강인만, 신형철

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IEEK Fall Conference 2005

윤영창, Hochul Lee, 강인만, 신형철, “Low frequency noise characteristics of the 180nm MOSFETs,” IEEK Fall Conference 2005, Seoul, Korea, pp.861-864, November 26, 2005

[IEEK Fall Conference 2005] Low frequency noise characteristics of the 180nm MOSFETs

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