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Seoul National University Device Research Laboratory

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Home · Analysis of Variation and Ferroelectric Layer Thickness on Negative Capacitance Nanowire Field-Effect Transistor
Home · Analysis of Variation and Ferroelectric Layer Thickness on Negative Capacitance Nanowire Field-Effect Transistor

Analysis of Variation and Ferroelectric Layer Thickness on Negative Capacitance Nanowire Field-Effect Transistor

저자

Jangkyu Lee, Changbeom Woo, Jongsu Kim, Myounggon Kang, Jongwook Jeon, and Hyungcheol Shin

저널 정보

Journal of Nanoscience and Nanotechnology

출간연도

2019

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