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Seoul National University Device Research Laboratory

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Home · Machine learning model for predicting threshold voltage by taper angle variation and word line position in 3D NAND flash memory
Home · Machine learning model for predicting threshold voltage by taper angle variation and word line position in 3D NAND flash memory

Machine learning model for predicting threshold voltage by taper angle variation and word line position in 3D NAND flash memory

저자

Dongchan Lee and Hyungcheol Shin

저널 정보

IEICE Electronics Express

출간연도

2021

링크

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