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Threshold Voltage Fluctuation by Random Telegraph Noise in Floating Gate nand Flash Memory String

저자

Sung-Min Joe, Jeong-Hyong Yi, Sung-Kye Park, Hyungcheol Shin, Byung-Gook Park, Young June Park, and Jong-Ho Lee

저널 정보

IEEE Transactions on Electron Devices(TED)

출간연도

2011

링크