JOURNAL

Modeling of effective mobility in 3D NAND flash memory with polycrystalline silicon channel

Juhyun Kim, Hyungcheol Shin

2025

Journal of Computational Electronics

Investigation of Random Telegraph Noise Scaling Dependency in 3-D NAND Using Monte Carlo Simulator

Eunseok Oh, Hyungcheol Shin

2025

IEEE Transactions on Electron Devices

Investigation of Cell Variation Effect on Z-Interference in Charge-Trap-Based 3-D NAND Flash Memory

Sangmin Ahn, Hyungjun Jo, Sechun Park, Jongwoo Kim, Hyungcheol Shin

2025

IEEE Transactions on Electron Devices

Compact Modeling of Trap-Assisted Tunneling Current in 3-D nand Flash Memory

Hyungjun Jo, Hyungcheol Shin

2025

IEEE Transactions on Electron Devices

Integra-NANDSim: A New VT Distribution Simulator of 3-D NAND Flash Memories

Jinil Yoo, Sangmin Ahn, Hyungcheol Shin

2024

IEEE Journal of the Electron Devices Society

Machine Learning-Based Prediction of Threshold Voltage Distribution Due to Lateral Migration in 3-D NAND Flash Memory

Insang Han, Jang Kyu Lee, Sangmin Ahn, Hyungcheol Shin

2024

IEEE Transactions on Electron Devices