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저자

Yongmin Kwon, Yeonsung Kang, Sanghoon Lee, Byung-Gook Park, and Hyungcheol Shin

저널 정보

Journal of Semiconductor Technology and Science

출간연도

2010

Abstract: 

Threshold voltage is one of the most important factors in a device modeling. In this paper, analytical method to calculate threshold voltage for recessed channel (RC) MOSFETs is studied. If we know the fundamental parameter of device, such as radius, oxide thickness and doping concentration, threshold voltage can be obtained easily by using this model. The model predicts the threshold voltage which is the result of 2D numerical device simulation.