A New Semi-Analytical Model for Erase Transients of 3-D Gate-All-Around (GAA) NAND Flash Memories

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Home · A New Semi-Analytical Model for Erase Transients of 3-D Gate-All-Around (GAA) NAND Flash Memories

저자

Jinil Yoo, Haechan Choi, Hyungcheol Shin

저널 정보

IEEE Transactions on Electron Devices(TED)

출간연도

2024

링크