A Subthreshold Slope and Low-frequency Noise Characteristics in Charge Trap Flash Memories with Gate-All-Around and Planar Structure

Home · A Subthreshold Slope and Low-frequency Noise Characteristics in Charge Trap Flash Memories with Gate-All-Around and Planar Structure

저자

Myoung-Sun Lee, Sung-Min Joe, Jang-Gn Yun, Hyungcheol Shin, Byung-Gook Park, Sang-Sik Park, and Jong-Ho Lee

저널 정보

Journal of Semiconductor Technology and Science

출간연도

2012

링크