Accurate Extraction of Effective Channel Length and Source/Drain Series Resistance in Ultrashort-Channel MOSFETs by Iteration Method

Home · Accurate Extraction of Effective Channel Length and Source/Drain Series Resistance in Ultrashort-Channel MOSFETs by Iteration Method

저자

Junsoo Kim, Jaehong Lee, Ickhyun Song, Yoenam Yun, Jong Duk Lee, Byung-Gook Park, and Hyungcheol Shin

저널 정보

IEEE Transaction on Electron Devices (TED)

출간연도

2008

링크