Capture-cross-section conversion ratio for compact models enabling fast VT distribution simulation of 3-D NAND flash memory

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저자

Haechan Choi, Sangmin Ahn, Jinil Yoo, Sungju Kim, Myung Jin and Hyungcheol Shin

저널 정보

Japanese Journal of Applied Physics (JJAP)

출간연도

2026

링크