Capture Cross Section of Traps Causing Random Telegraph Noise in Gate-Induced Drain Leakage Current

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Home · Capture Cross Section of Traps Causing Random Telegraph Noise in Gate-Induced Drain Leakage Current

저자

Sung-Won Yoo, Younghwan Son and Hyungcheol Shin

저널 정보

IEEE Transactions on Electron Devices(TED)

출간연도

2013

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