Characterizing traps causing random telegraph noise during trap-assisted tunneling gate-induced drain leakage

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저자

Sung-Won Yoo, Joonha Shin, Youngsoo Seo, Hyunsuk Kim, Sangbin Jeon, Hyunsoo Kim and Hyungcheol Shin

저널 정보

Solid-State Electronics

출간연도

2015

링크