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Compact Modeling of Trap-Assisted Tunneling Current in 3-D nand Flash Memory
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Compact Modeling of Trap-Assisted Tunneling Current in 3-D nand Flash Memory
Compact Modeling of Trap-Assisted Tunneling Current in 3-D nand Flash Memory
저자
Hyungjun Jo, Hyungcheol Shin
저널 정보
IEEE Transactions on Electron Devices
출간연도
2025
링크
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Integra-NANDSim: A New VT Distribution Simulator of 3-D NAND Flash Memories
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Investigation of Cell Variation Effect on Z-Interference in Charge-Trap-Based 3-D NAND Flash Memory
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