Comparison for Performance and Reliability Between Nanowire FET and FinFET versus Technology Node

Home · Comparison for Performance and Reliability Between Nanowire FET and FinFET versus Technology Node

저자

Hyunsuk Kim, Youngsoo Seo, Ilho Myeong, Minsoo Kim, Myounggon Kang and Hyungcheol Shin

저널 정보

Journal of Nanoscience and Nanotechnology

출간연도

2017

링크