Comparison of Low-Frequency Noise in Channel and Gate-Induced Drain Leakage Currents of High-k nFETs

Home · Comparison of Low-Frequency Noise in Channel and Gate-Induced Drain Leakage Currents of High-k nFETs

저자

Ju-Wan Lee, Byoung Hun Lee, Hyungcheol Shin, Byung-Gook Park, Young June Park, and Jong-Ho Lee

저널 정보

IEEE Electron Device Letters (EDL)

출간연도

2010

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