Comparison of work function variation between FinFET and 3D stacked nanowire FET devices for 6-T SRAM reliability

TOP

Home · Comparison of work function variation between FinFET and 3D stacked nanowire FET devices for 6-T SRAM reliability

저자

Kyul Ko, Dokyun Son, Myounggon Kang and Hyungcheol Shin

저널 정보

Solid-State Electronics

출간연도

2018

링크