Experimental Investigation of Quasi-Ballistic Carrier Transport Characteristics in 10-nm Scale MOSFETs

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저자

Jaehong Lee, Jongwook Jeon, Junsoo Kim, Byung-Gook Park, Jong Duk Lee, and Hyungcheol Shin

저널 정보

IEEE Transactions on Nanotechnology

출간연도

2011

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