f max Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor

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저자

Jhon Hee Sauk, Lee Jaehong, Jae Ho Lee, Byoungchan Oh, Song Ickhyun, Yoon Yeonam, Byung-Gook Park, Jong Duk Lee, and Hyungcheol Shin

저널 정보

IEEE Electron Device Letters (EDL)

출간연도

2009

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