FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETs

Home · FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETs

저자

Lee Hochul, Youngchang Yoon, Song Ickhyun, Hyungcheol Shin

저널 정보

IEICE Transactions on Electronics

출간연도

2008

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