GIDL analysis of the process variation effect in gate-all-around nanowire FET

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Home · GIDL analysis of the process variation effect in gate-all-around nanowire FET

저자

Shinkeun Kim, Youngsoo Seo, Jangkyu Lee, Myounggon Kang and Hyungcheol Shin

저널 정보

Solid-State Electronics

출간연도

2018

링크