Investigation and Compact Modeling of Hot-Carrier Injection for Read Disturbance in 3-D NAND Flash Memory

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Home · Investigation and Compact Modeling of Hot-Carrier Injection for Read Disturbance in 3-D NAND Flash Memory

저자

Dokyun Son, Jaeyeol Park, and Hyungcheol Shin

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IEEE Transactions on Electron Devices(TED)

출간연도

2020

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