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Investigation and SPICE Compact Model of Spacer Region for Static Characteristics of 3-D NAND Flash Memories
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Investigation and SPICE Compact Model of Spacer Region for Static Characteristics of 3-D NAND Flash Memories
Investigation and SPICE Compact Model of Spacer Region for Static Characteristics of 3-D NAND Flash Memories
저자
Minsoo Kim and Hyungcheol Shin
저널 정보
IEEE Transactions on Electron Devices(TED)
출간연도
2020
링크
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이전
Machine learning method to predict threshold voltage distribution by read disturbance in 3D NAND Flash Memories
다음
Cell Pattern Dependency of Charge Failure Mechanisms During Short-Term Retention in 3-D NAND Flash Memories
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