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Investigation of Frequency Dependent Sensitivity of Noise Figure on Device Parameters in 65 nm CMOS

저자

Minsuk Koo, Hakchul Jung, Hee-Sauk Jhon, Byung-Gook Park, Jong Duk Lee, and , Hyungcheol Shin

저널 정보

Journal of Semiconductor Technolegy and Science

출간연도

2009

Abstract

We have investigated the noise sensitivity of low noise amplifier (LNA) at different frequency. This noise sensitivity analysis provides insights about noise parameters and it is very beneficial for making appropriate design trade-offs. From this work, the circuit designer can choose the adequate noise parameters tolerances.