Investigation of Frequency Dependent Sensitivity of Noise Figure on Device Parameters in 65 nm CMOS

Home · Investigation of Frequency Dependent Sensitivity of Noise Figure on Device Parameters in 65 nm CMOS

저자

Minsuk Koo, Hakchul Jung, Hee-Sauk Jhon, Byung-Gook Park, Jong Duk Lee, and , Hyungcheol Shin

저널 정보

Journal of Semiconductor Technolegy and Science

출간연도

2009

링크