New Insight Into Negative Bias Temperature Instability Degradation During Self-Heating in Nanoscale Bulk FinFETs

Home · New Insight Into Negative Bias Temperature Instability Degradation During Self-Heating in Nanoscale Bulk FinFETs

저자

Dokyun Son, Kyushik Hong, Hyewon Shim, Sangwoo Pae, and Hyungcheol Shin

저널 정보

IEEE Electron Device Letters (EDL)

출간연도

2019

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