Observation of Slow Oxide Traps at MOSFETs Having Metal/High-k Gate Dielectric Stack in Accumulation Mode

Home · Observation of Slow Oxide Traps at MOSFETs Having Metal/High-k Gate Dielectric Stack in Accumulation Mode

저자

Heung-Jae Cho, Younghwan Son, Byoungchan Oh, Sanghoon Lee, Jong-Ho Lee, Byung-Gook Park, and Hyungcheol Shin

저널 정보

IEEE Transactions on Electron Devices(TED)

출간연도

2010

링크