Prediction of Random Grain Boundary Variation Effect of 3-D NAND Flash Memory Using a Machine Learning Approach

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Home · Prediction of Random Grain Boundary Variation Effect of 3-D NAND Flash Memory Using a Machine Learning Approach

저자

Jang Kyu Lee, Kyul Ko, and Hyungcheol Shin

저널 정보

IEEE Transactions on Electron Devices(TED)

출간연도

2022

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